Showing results: 31 - 45 of 268 items found.
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Keysight Technologies
Keysight's DDR4 parametric test reference solution helps verify the signal integrity of DDR4 memory designs according to JEDEC specifications.
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James Instruments Inc.
James Instruments? digital test hammers are an advanced, completely automated system for estimating concrete compressive strength. Its calculation, memory and recording functions allow for quick, easy and accurate test results.
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Teledyne LeCroy
Compute Express Link (CXL) is a new high-speed CPU-to-Device and CPU-to-Memory interconnect designed to accelerate next-generation data center performance. CXL technology maintains memory coherency between the CPU memory space and memory on attached devices, which allows resource sharing for higher performance, reduced software stack complexity, and lower overall system cost. This permits users to simply focus on target workloads as opposed to the redundant memory management hardware in their accelerators. CXL is based on a PCI Express 5.0 Physical layer with speeds up to 32GT/s. Teledyne LeCroy provides protocol analysis test equipment to support development and debug of CXL based devices.
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ATS5004D -
TEAM SOLUTIONS, INC.
Automotive oscilloscope with 4 differential channels, 50 MS/s, 12/14/16 bit, integrated SureConnect connection test, 128 kSamples memory per channel.
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DU331/332/333 -
Delta United Instrument Co., Ltd.
Large LCD Display Window for Setups and Test Values Output Frequency 50/60 HZ SelectableAll Initial Default Function Setting scan be Changed Easily to Fit RequirementEasy Manual Driven with Cursor Guiding Operation Mode Battery Backup Function will Recall theTest Parameter Settings before Power offLarge Memory (100 sets) for Setup Steps & ParametersEach Memory offers 9 steps of different Test ParametersTest mode: Single Step, Multiple Steps (Step by Step), Test Circle Number or Continuous Test are Programmable DU333 is designed for Multi-point Scan Test DU331/DU332 can perform Multi - point Test when used with Scan Box DU330
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MemTest86 -
PassMark Software Pty Ltd
MemTest86 is the original, free, stand alone memory testing software for x86 computers. MemTest86 boots from a USB flash drive or CD and tests the RAM in your computer for faults using a series of comprehensive algorithms and test patterns.
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CloudTesting™ -
Cloud Testing Service, Inc.
All-in-one platform for semiconductor test and measurement Extensive test and measurement library Microcontroller, Memory, Analog and more. CloudTesting™ Service is the test and measurement system that you can build your own environment by selecting and combining Testing IPs. Fees for Testing IPs are paid monthly.
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FS2660A -
FuturePlus Systems
The FS2660A is our newest and fastest logic analyzer probe used to test DDR5 RDIMM or LRDIMM memory. It is designed to work exclusively with 2 Keysight U4164A logic analysis modules operating with CHA + CHB independent busses. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 RDIMM/LRDIMMs and DDR5 Memory Channels.
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VX2022 -
VX Instruments GmbH
The VX2022 is a high-speed (20MS/s), 12Bit, digitizer for high performance measurements. Up to two input channels can be installed in the VX2022 with standard 2MS (4MByte) of memory. The VX2022, "C" size single slot VXI module, is designed for high throughput testing. Multiple measurements in combination with the memory segmenting feature results in additional test time improvement.
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MICRONICS JAPAN CO.LTD.
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
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JT 2127/Flex Socket Test Module -
JTAG Technologies Inc.
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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TP-ADK5004D -
TEAM SOLUTIONS, INC.
Kit includes: Automotive oscilloscope with 4 differential channels, 50 MS/s, 12/14/16 bit, integrated SureConnect connection test, 128 kSamples memory per channel.
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ATS605004D-XMS -
TEAM SOLUTIONS, INC.
Automotive oscilloscope with 4 differential channels, 500MS/s, 250MHz BW, 12/14/16 bit, integrated SureConnect connection test and up to 257 MSamples memory per channel.
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Tessent® -
Mentor Graphics Corp.
The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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MS7208 -
MiNT Systems Corporation
The MS7208 system can test a wide range of device families including – but not limited to – NAND flash, NOR flash, multi-level flash, multi-die flash, EEPROM, RAM, and mixed-technology memory devices.
